Title: Adaptive estimator of the memory parameter and goodness-of-fit test using a multidimensional increment ratio statistic

Abstract: The Increment Ratio (IR) statistic was first defined and studied in Surgailis {\it et al.} (2008) for estimating the long-memory parameter either of a stationary or an increment stationary Gaussian process. Three extensions, for stationary processes only, are proposed here. Firstly, a multidimensional central limit theorem is established for a vector composed by several IR statistics. Secondly, a $\chi^2$-type test is deduced from this theorem. Finally, adaptive versions of the estimator and the test are studied in a general semiparametric frame. The adaptive estimator of the long-memory parameter is proved to follow an oracle property. Simulations attest of the accuracies and robustness of the estimator and test, even in the non Gaussian case.