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Condensed Matter > Statistical Mechanics

Title: Pattern recognition at different scales: a statistical perspective

Abstract: In this paper we borrow concepts from Information Theory and Statistical Mechanics to perform a pattern recognition procedure on a set of x-ray hazelnut images. We identify two relevant statistical scales, whose ratio affects the performance of a machine learning algorithm based on statistical observables, and discuss the dependence of such scales on the image resolution. Finally, by averaging the performance of a Support Vector Machines algorithm over a set of training samples, we numerically verify the predicted onset of an optimal scale of resolution, at which the pattern recognition is favoured.
Subjects: Statistical Mechanics (cond-mat.stat-mech); Disordered Systems and Neural Networks (cond-mat.dis-nn)
DOI: 10.1016/j.chaos.2013.10.006
Cite as: arXiv:1404.2638 [cond-mat.stat-mech]
  (or arXiv:1404.2638v1 [cond-mat.stat-mech] for this version)

Submission history

From: Matteo Colangeli [view email]
[v1] Wed, 9 Apr 2014 21:44:56 GMT (2310kb,D)

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