Current browse context:
cond-mat.mtrl-sci
Change to browse by:
References & Citations
Condensed Matter > Materials Science
Title: Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy
(Submitted on 8 May 2014 (v1), last revised 9 May 2014 (this version, v2))
Abstract: High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics.
Submission history
From: Dennis Meier [view email][v1] Thu, 8 May 2014 19:15:54 GMT (2688kb)
[v2] Fri, 9 May 2014 09:04:08 GMT (2688kb)
Link back to: arXiv, form interface, contact.