Title: In-situ Piezoresponse Force Microscopy Cantilever Shape Profiling

Abstract: The frequency dependent amplitude and phase shown in many Piezoresponse Force Microscopy (PFM) measurements are shown to be a consequence of the extended nature of Atomic Force Microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever shape as a function of changes in the boundary conditions (forces and frequencies) are the ultimate source of the sensitivity of cantilevers to forces between the tip and the sample. Because conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam location (typically near the end of the cantilever), the choice of this location will by necessity provide a limited picture of the total cantilever motion. In this work, the frequency dependence of PFM is in part explained in part by experimental measurements of the shape of the oscillating cantilever beam. This choice of spot location, typically at the end of the cantilever can lead to strong variations in the response of the lever stemming from changes in the cantilever sensor rather than from the response of the sample. It is well known that long-ranged electrostatics, since they can lead to a response at the drive frequency, contribute to the measured PFM signal. The significance of the electrostatics versus the piezoresponse depends on the optical detector Spot location on the cantilever. In particular, the optical sensitivity and the phase of the response is frequency dependent. Sample stiffness also contributes to complications and in some cases, in addition to conventional piezo-electromechanical effects causing hysteresis in the amplitude and phase observables, hysteresis in these observables can also stem from changes in the tip-sample stiffness, such as we might expect from localized electrochemical reactions.