Title: Certification of Boson Sampling Devices with Coarse-Grained Measurements

Abstract: A boson sampling device could efficiently sample from the output probability distribution of noninteracting bosons undergoing many-body interference. This problem is not only classically intractable, but its solution is also believed to be classically unverifiable. Hence, a major difficulty in experiment is to ensure a boson sampling device performs correctly. We present an experimental friendly scheme to extract useful and robust information from the quantum boson samplers based on coarse-grained measurements. The procedure can be applied to certify the equivalence of boson sampling devices while ruling out alternative fraudulent devices. We perform numerical simulations to demonstrate the feasibility of the method and consider the effects of realistic noise. Our approach is expected to be generally applicable to other many-body certification tasks beyond the boson sampling problem.