Title: Beating the Shot-Noise Limit with Sources of Partially-Distinguishable Photons

Abstract: Quantum metrology promises high-precision measurements beyond the capability of any classical techniques, and has the potential to be integral to investigative techniques. However, all sensors must tolerate imperfections if they are to be practical. Here we show that photons with perfectly overlapped modes, which are therefore fully indistinguishable, are not required for quantum-enhanced measurement, and that partially-distinguishable photons do not have to be engineered to mitigate the adverse effects of distinguishability. We quantify the effect of distinguishability on quantum metrology experiments, and report results of an experiment to verify that two- and four-photon states containing partially-distinguishable photons can achieve quantum-enhanced sensitivity with low-visibility quantum interference. This demonstrates that sources producing photons with mixed spectral states can be readily utilized for quantum metrology.