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Physics > Data Analysis, Statistics and Probability

Title: A deep learning approach to single-particle recognition in cryo-electron microscopy

Abstract: Particle extraction represents a major practical bottleneck in the structure determination of biological macromolecular complexes by single-particle cryo-electron microscopy (cryo-EM). We developed a deep learning-based algorithmic framework, DeepEM, for single-particle recognition from noisy cryo-EM micrographs, enabling automated particle picking, selection and verification in an integrated fashion. Our approach exhibits improved performance and high accuracy when tested on the standard KLH dataset as well as several challenging experimental cryo-EM datasets.
Comments: 18 pages, 3 figures
Subjects: Data Analysis, Statistics and Probability (physics.data-an); Computer Vision and Pattern Recognition (cs.CV)
Cite as: arXiv:1605.05543 [physics.data-an]
  (or arXiv:1605.05543v1 [physics.data-an] for this version)

Submission history

From: Youdong Mao [view email]
[v1] Wed, 18 May 2016 12:15:10 GMT (2620kb)
[v2] Sat, 31 Dec 2016 07:22:21 GMT (4241kb)

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