References & Citations
Statistics > Applications
Title: Data-Driven Sensitivity Inference for Thomson Scattering Electron Density Measurement Systems
(Submitted on 19 Jul 2016 (v1), last revised 12 Dec 2016 (this version, v4))
Abstract: We developed a method to infer the calibration parameters of multichannel measurement systems, such as channel variations of sensitivity and noise amplitude, from experimental data. We regard such uncertainties of the calibration parameters as dependent noise. The statistical properties of the dependent noise and that of the latent functions were modeled and implemented in the Gaussian process kernel. Based on their statistical difference, both parameters were inferred from the data.
We applied this method to the electron density measurement system by Thomson scattering for Large Helical Device plasma, which is equipped with 141 spatial channels. Based on the 210 sets of experimental data, we evaluated the correction factor of the sensitivity and noise amplitude for each channel. The correction factor varies by $\approx$ 10\%, and the random noise amplitude is $\approx$ 2\%, i.e., the measurement accuracy increases by a factor of 5 after this sensitivity correction. The certainty improvement in the spatial derivative inference was demonstrated.
Submission history
From: Keisuke Fujii [view email][v1] Tue, 19 Jul 2016 02:33:38 GMT (2195kb,D)
[v2] Tue, 23 Aug 2016 08:30:26 GMT (2195kb,D)
[v3] Thu, 13 Oct 2016 10:02:52 GMT (2768kb,D)
[v4] Mon, 12 Dec 2016 04:46:11 GMT (2921kb,D)
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