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Mathematics > Statistics Theory

Title: Testing Gaussian Process with Applications to Super-Resolution

Abstract: This article introduces exact testing procedures on the mean of a Gaussian process $X$ derived from the outcomes of $\ell_1$-minimization over the space of complex valued measures. The process $X$ can thought as the sum of two terms: first, the convolution between some kernel and a target atomic measure (mean of the process); second, a random perturbation by an additive (centered) Gaussian process. The first testing procedure considered is based on a dense sequence of grids on the index set of $X$ and we establish that it converges (as the grid step tends to zero) to a randomized testing procedure: the decision of the test depends on the observation $X$ and also on an independent random variable. The second testing procedure is based on the maxima and the Hessian of $X$ in a grid-less manner. We show that both testing procedures can be performed when the variance is unknown (and the correlation function of $X$ is known). These testing procedures can be used for the problem of deconvolution over the space of complex valued measures, and applications in frame of the Super-Resolution theory are presented. As a byproduct, numerical investigations may demonstrate that our grid-less method is more powerful (it detects sparse alternatives) than tests based on very thin grids.
Comments: 34 pages, 5 figures; this new version essentially put more emphasis on the comparison between grid methods and "grid-less" methods
Subjects: Statistics Theory (math.ST); Information Theory (cs.IT); Probability (math.PR)
MSC classes: 62E15, 62F03, 60G15, 62H10, 62H15 (Primary) 60E05, 60G10, 62J05, 94A08 (secondary)
Cite as: arXiv:1706.00679 [math.ST]
  (or arXiv:1706.00679v2 [math.ST] for this version)

Submission history

From: Yohann De Castro [view email]
[v1] Fri, 2 Jun 2017 13:17:03 GMT (1965kb,D)
[v2] Tue, 14 Nov 2017 21:37:50 GMT (2444kb,D)
[v3] Mon, 2 Jul 2018 13:07:55 GMT (2712kb,D)

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