Current browse context:
cond-mat.mes-hall
Change to browse by:
References & Citations
Condensed Matter > Mesoscale and Nanoscale Physics
Title: Vector Electric Field Measurement via Position-Modulated Kelvin Probe Force Microscopy
(Submitted on 18 Oct 2017 (v1), last revised 27 Oct 2017 (this version, v2))
Abstract: High-quality spatially-resolved measurements of electric fields are critical to understanding charge injection, charge transport, and charge trapping in semiconducting materials. Here, we report a variation of frequency-modulated Kelvin probe force microscopy (FM-KPFM) that enables spatially-resolved measurements of the electric field. We measure electric field components along multiple directions simultaneously by employing position modulation and lock-in detection in addition to numeric differentiation of the surface potential. We demonstrate the technique by recording linescans of the in-plane electric field vector in the vicinity of a patch of trapped charge in a DPh-BTBT organic field-effect transistor. This technique is simple to implement and should be especially useful for studying electric fields in spatially inhomogeneous samples like organic transistors and photovoltaic blends.
Submission history
From: Ryan Dwyer [view email][v1] Wed, 18 Oct 2017 20:27:54 GMT (3954kb)
[v2] Fri, 27 Oct 2017 17:51:14 GMT (3950kb)
Link back to: arXiv, form interface, contact.