Title: Fourier plane optical microscopy and spectroscopy

Abstract: Intensity, wavevector, phase, and polarization are the most important parameters of any light beam. Understanding the wavevector distribution has emerged as a very important problem in recent days, especially at nanoscale. It provides unique information about the light-matter interaction. Back focal plane or Fourier plane imaging and spectroscopy techniques help to measure wavevector distribution not only from single molecules and single nanostructures but also from metasurfaces and metamaterials. This review provides a birds-eye view on the technique of back focal imaging and spectroscopy, different methodologies used in developing the technique and applications including angular emission patterns of fluorescence and Raman signals from molecules, elastic scattering etc. We first discuss on the information one can obtain at the back focal plane of the objective lens according to both imaging and spectroscopy viewpoints and then discuss the possible configurations utilized to project back focal plane of the objective lens onto the imaging camera or to the spectroscope. We also discuss the possible sources of error in such measurements and possible ways to overcome it and then elucidate the possible applications.