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Physics > Optics

Title: X-ray optics and beam characterization using random modulation: Theory

Abstract: X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide a generalization of the concept. As we also demonstrate experimentally in another paper, the methods theoretically developed here can be applied with different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the best suited approach for each metrology scenario.
Comments: 10 pages, 3 figures, 1 table
Subjects: Optics (physics.optics); Applied Physics (physics.app-ph)
DOI: 10.1107/S1600577520000491
Cite as: arXiv:1902.09418 [physics.optics]
  (or arXiv:1902.09418v4 [physics.optics] for this version)

Submission history

From: Sebastien Berujon [view email]
[v1] Mon, 25 Feb 2019 16:33:56 GMT (2920kb,D)
[v2] Tue, 30 Jul 2019 03:23:53 GMT (2920kb,D)
[v3] Mon, 2 Dec 2019 20:10:22 GMT (379kb,D)
[v4] Tue, 3 Mar 2020 16:46:27 GMT (379kb,D)

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