Title: X-ray optics and beam characterization using random modulation

Abstract: X-ray near-field speckle-based phase-sensing approaches provide an efficient means to characterize optical elements. Here, we present a theoretical review of several of these speckle methods and show some experimental applications for characterizing both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport x-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.