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Condensed Matter > Materials Science

Title: Usage of Scherrer's formula in X-ray diffraction analysis of size distribution in systems of monocrystalline nanoparticles

Abstract: In the supporting information file of the article Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles (Crystal Growth & Design 2019), there is a description on how to use Scherrer equation for in situ X-ray diffraction analysis of crystallization processes investigated in the article. That description led to a necessary revaluation on the current understanding of the usage of Scherrer equation for analyzing size distributions, as discussed in this work.
Comments: 9 pages, 3 figures, 11 references
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1911.00701 [cond-mat.mtrl-sci]
  (or arXiv:1911.00701v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Sérgio Morelhão L [view email]
[v1] Sat, 2 Nov 2019 12:06:23 GMT (388kb,D)

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