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Physics > Instrumentation and Detectors

Title: X-ray optics and beam characterisation using random modulation: Experiments

Abstract: In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.
Comments: 13 pages, 13 figures. arXiv admin note: substantial text overlap with arXiv:1902.09418
Subjects: Instrumentation and Detectors (physics.ins-det); Optics (physics.optics)
Cite as: arXiv:1912.05432 [physics.ins-det]
  (or arXiv:1912.05432v1 [physics.ins-det] for this version)

Submission history

From: Sebastien Berujon [view email]
[v1] Tue, 3 Dec 2019 02:10:35 GMT (8145kb,D)

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