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Physics > Instrumentation and Detectors
Title: X-ray optics and beam characterisation using random modulation: Experiments
(Submitted on 3 Dec 2019)
Abstract: In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.
Submission history
From: Sebastien Berujon [view email][v1] Tue, 3 Dec 2019 02:10:35 GMT (8145kb,D)
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