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Condensed Matter > Mesoscale and Nanoscale Physics

Title: Demonstration of electron focusing using electronic lenses in low-dimensional system

Abstract: We report an all-electric integrable electron focusing lens in n-type GaAs. It is shown that a pronounced focusing peak takes place when the focal point aligns with an on-chip detector. The intensity and full width half maximum (FWHM) of the focusing peak are associated with the collimation of injected electrons. To demonstrate the reported focusing lens can be a useful tool, we investigate characteristic of an asymmetrically gate biased quantum point contact with the assistance of focusing lens. A correlation between the occurrence of conductance anomaly in low conductance regime and increase in FWHM of focusing peak is observed. The correlation is likely due to the electron-electron interaction. The reported electron focusing lens is essential for a more advanced electron optics device.
Subjects: Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
Journal reference: Sci Rep 10, 2593 (2020)
DOI: 10.1038/s41598-020-59453-x
Cite as: arXiv:2002.04307 [cond-mat.mes-hall]
  (or arXiv:2002.04307v1 [cond-mat.mes-hall] for this version)

Submission history

From: Chengyu Yan [view email]
[v1] Tue, 11 Feb 2020 10:57:46 GMT (1340kb,D)

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