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Computer Science > Hardware Architecture

Title: Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks

Abstract: With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can cause circuit-wide effects and thus, significantly contribute to the functional failure rate of the circuit. This paper proposes a methodology to analyse how the functional behaviour is affected by Single-Event Transients in the clock distribution network. The approach is based on logic-level simulation and thus, only uses the register-transfer level description of a design. Therefore, a fault model is proposed which implements the main effects due to radiation-induced transients in the clock network. This fault model enables the computation of the functional failure rate caused by Single-Event Transients for each individual clock buffer, as well as the complete network. Further, it allows the identification of the most vulnerable flip-flops related to Single-Event Transients in the clock network.
The proposed methodology is applied in a practical example and a fault injection campaign is performed. In order to evaluate the impact of Single-Event Transients in clock distribution networks, the obtained functional failure rate is compared to the error rate caused by Single-Event Upsets in the sequential logic.
Subjects: Hardware Architecture (cs.AR)
DOI: 10.1109/DTIS.2019.8735052
Cite as: arXiv:2002.05455 [cs.AR]
  (or arXiv:2002.05455v1 [cs.AR] for this version)

Submission history

From: Thomas Lange [view email]
[v1] Thu, 13 Feb 2020 11:38:15 GMT (22kb)

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