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Condensed Matter > Materials Science
Title: High resolution strain measurements in highly disordered materials
(Submitted on 27 Apr 2020 (v1), last revised 28 Dec 2020 (this version, v3))
Abstract: The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, a new analysis of speckle diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing for strain (or flow) patterns to be inferred. This speckle tracking technique measures strain patterns with a accuracy similar to x-ray single crystal measurements but in amorphous or highly disordered materials.
Submission history
From: Mark Sutton [view email][v1] Mon, 27 Apr 2020 14:12:43 GMT (825kb,D)
[v2] Mon, 1 Jun 2020 16:15:14 GMT (822kb,D)
[v3] Mon, 28 Dec 2020 21:05:10 GMT (6492kb,D)
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