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Electrical Engineering and Systems Science > Image and Video Processing

Title: Review: Deep Learning in Electron Microscopy

Authors: Jeffrey M. Ede
(Submitted on 17 Sep 2020 (v1), last revised 8 Mar 2021 (this version, v7))
Abstract: Deep learning is transforming most areas of science and technology, including electron microscopy. This review paper offers a practical perspective aimed at developers with limited familiarity. For context, we review popular applications of deep learning in electron microscopy. Afterwards, we discuss hardware and software needed to get started with deep learning and interface with electron microscopes. We then review neural network components, popular architectures, and their optimization. Finally, we discuss future directions of deep learning in electron microscopy.
Comments: 33 pages, 16 figures + 2 tables + 65 pages of references
Subjects: Image and Video Processing (eess.IV); Materials Science (cond-mat.mtrl-sci); Computer Vision and Pattern Recognition (cs.CV); Machine Learning (cs.LG)
DOI: 10.1088/2632-2153/abd614
Cite as: arXiv:2009.08328 [eess.IV]
  (or arXiv:2009.08328v7 [eess.IV] for this version)

Submission history

From: Jeffrey Ede BSc MPhys [view email]
[v1] Thu, 17 Sep 2020 14:23:55 GMT (4426kb,D)
[v2] Fri, 18 Sep 2020 14:38:31 GMT (4426kb,D)
[v3] Mon, 5 Oct 2020 07:22:38 GMT (6323kb,D)
[v4] Tue, 3 Nov 2020 15:38:31 GMT (5804kb,D)
[v5] Sun, 27 Dec 2020 22:14:24 GMT (5806kb,D)
[v6] Thu, 31 Dec 2020 18:28:54 GMT (5807kb,D)
[v7] Mon, 8 Mar 2021 10:12:04 GMT (5807kb,D)
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