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Condensed Matter > Materials Science

Title: Work function seen with sub-meV precision through laser photoemission

Abstract: Electron emission can be utilised to measure the work function of the surface. However, the number of significant digits in the values obtained through thermionic-, field- and photo-emission techniques is typically just two or three. Here, we show that the number can go up to five when angle-resolved photoemission spectroscopy (ARPES) is applied. This owes to the capability of ARPES to detect the slowest photoelectrons that are directed only along the surface normal. By using a laser-based source, we optimised our setup for the slow photoelectrons and resolved the slowest-end cutoff of Au(111) with the sharpness not deteriorated by the bandwidth of light nor by Fermi-Dirac distribution. The work function was leveled within $\pm$0.4 meV at least from 30 to 90 K and the surface aging was discerned as a meV shift of the work function. Our study opens the investigations into the fifth significant digit of the work function.
Comments: For an associated blog-type posting, see this https URL
Subjects: Materials Science (cond-mat.mtrl-sci)
Journal reference: Communications Physics 3, 158 (2020)
DOI: 10.1038/s42005-020-00426-x
Cite as: arXiv:2009.09765 [cond-mat.mtrl-sci]
  (or arXiv:2009.09765v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Yukiaki Ishida [view email]
[v1] Mon, 21 Sep 2020 11:31:21 GMT (11637kb)

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