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Condensed Matter > Materials Science

Title: Complementary LEEM and eV-TEM for imaging and spectroscopy

Authors: Peter S. Neu (1), Daniël Geelen (1), Aniket Thete (1), Rudolf M. Tromp (1 and 2), Sense Jan van der Molen (1) ((1) Leiden Institute of Physics, (2) IBM T.J. Watson Research Center)
Abstract: Transmission electron microscopy at very low energy is a promising way to avoid damaging delicate biological samples with the incident electrons, a known problem in conventional transmission electron microscopy. For imaging in the 0-30 eV range, we added a second electron source to a low energy electron microscopy (LEEM) setup, enabling imaging in both transmission and reflection mode at nanometer (nm) resolution. The latter is experimentally demonstrated for free-standing graphene. Exemplary eV-TEM micrographs of gold nanoparticles suspended on graphene and of DNA origami rectangles on graphene oxide further establish the capabilities of the technique. The long and short axes of the DNA origami rectangles are discernable even after an hour of illumination with low energy electrons. In combination with recent developments in 2D membranes, allowing for versatile sample preparation, eV-TEM is paving the way to damage-free imaging of biological samples at nm resolution.
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:2009.09856 [cond-mat.mtrl-sci]
  (or arXiv:2009.09856v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Peter Neu [view email]
[v1] Mon, 21 Sep 2020 13:33:13 GMT (2548kb)

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