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Physics > Instrumentation and Detectors

Title: Precision Measurement of Pixel Sensor Capacitance

Abstract: The capacitance of the charge collection node of a sensor system is an important parameter for the design of the analog front-end electronics. The analog front-end of high-granularity sensors like for example hybrid pixel detectors need to be optimized for timing resolution, power consumption, and electronics noise - parameters which all depend on the pixel capacitance. Current pixel detector developments for the HL-LHC upgrade typically use silicon sensors with a pixel size in the order of $50 \times 50 um^2$ which have a pixel capacitance of several tens of fF, depending on the sensor geometry. We have developed a dedicated integrated circuit to be bump-bonded to a pixel sensor, which enables a precise pixel capacitance measurement by using charge-based capacitance measurement method. In this paper, we will describe the measurement method and the implementation of the capacitance measurement chip (Pixcap65) and show measurement results of a planar pixel sensor whose pixel capacitance is influenced by variations of the implant geometry.
Comments: 13 pages, 12 figures
Subjects: Instrumentation and Detectors (physics.ins-det); High Energy Physics - Experiment (hep-ex)
Cite as: arXiv:2010.03267 [physics.ins-det]
  (or arXiv:2010.03267v2 [physics.ins-det] for this version)

Submission history

From: Hans Krüger [view email]
[v1] Wed, 7 Oct 2020 08:37:36 GMT (2213kb,D)
[v2] Wed, 21 Oct 2020 07:29:05 GMT (2213kb,D)

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