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Physics > Instrumentation and Detectors
Title: Measurement of the transmission secondary electron yield of nanometer-thick films in a prototype Timed Photon Counter
(Submitted on 23 Oct 2020)
Abstract: We measure the transmission secondary electron yield of nanometer-thick Al$_2$O$_3$/TiN/Al$_2$O$_3$ films using a prototype version of a Timed Photon Counter (TiPC). We discuss the method to measure the yield extensively. The yield is then measured as a function of landing energy between $1.2$ and $1.8$ keV and found to be in the range of $0.1$ ($1.2$ keV) to $0.9$ ($1.8$ keV). These results are in agreement to data obtained by a different, independent method. We therefore conclude that the prototype TiPC is able to characterise the thin films in terms of transmission secondary electron yield. Additionally, observed features which are unrelated to the yield determination are interpreted.
Submission history
From: Tom van der Reep [view email][v1] Fri, 23 Oct 2020 15:00:03 GMT (6960kb,D)
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