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Physics > Instrumentation and Detectors

Title: Machine learning assisted non-destructive transverse beam profile imaging

Abstract: We present a non-destructive beam profile imaging concept that utilizes machine learning tools, namely genetic algorithm with a gradient descent-like minimization. Electromagnetic fields around a charged beam carry information about its transverse profile. The electrodes of a stripline-type beam position monitor (with eight probes in this study) can pick up that information for visualization of the beam profile. We use a genetic algorithm to transform an arbitrary Gaussian beam in such a way that it eventually reconstructs the transverse position and the shape of the original beam. The algorithm requires a signal that is picked up by the stripline electrodes, and a (precise or approximate) knowledge of the beam size. It can visualize the profile of fairly distorted beams as well.
Comments: 7 pages, 5 figures
Subjects: Instrumentation and Detectors (physics.ins-det); High Energy Physics - Experiment (hep-ex); Accelerator Physics (physics.acc-ph); Computational Physics (physics.comp-ph)
Cite as: arXiv:2010.15243 [physics.ins-det]
  (or arXiv:2010.15243v1 [physics.ins-det] for this version)

Submission history

From: Selçuk Haciömeroğlu [view email]
[v1] Sun, 25 Oct 2020 02:40:46 GMT (1559kb,D)

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