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Electrical Engineering and Systems Science > Systems and Control

Title: DeepScaleTool : A Tool for the Accurate Estimation of Technology Scaling in the Deep-Submicron Era

Abstract: The estimation of classical CMOS "constant-field" or "Dennard" scaling methods that define scaling factors for various dimensional and electrical parameters have become less accurate in the deep-submicron regime, which drives the need for better estimation approaches especially in the educational and research domains. We present DeepScaleTool, a tool for the accurate estimation of deep-submicron technology scaling by modeling and curve fitting published data by a leading commercial fabrication company for silicon fabrication technology generations from 130~nm to 7~nm for the key parameters of area, delay, and energy. Compared to 10~nm--7~nm scaling data published by a leading foundry, the DeepScaleTool achieves an error of 1.7% in area, 2.5% in delay, and 5% in power. This compares favorably with another leading academic estimation method that achieves an error of 24% in area, 9.1% in delay, and 24.9% in power.
Comments: This paper has been accepted for the 2021 IEEE International Symposium on Circuits and Systems. \copyright 2021 IEEE. Copyright statements are posted on the first page. 5 Pages, 5 Figures
Subjects: Systems and Control (eess.SY); Hardware Architecture (cs.AR); Performance (cs.PF)
Cite as: arXiv:2102.10195 [eess.SY]
  (or arXiv:2102.10195v1 [eess.SY] for this version)

Submission history

From: Satyabrata Sarangi [view email]
[v1] Fri, 19 Feb 2021 22:53:44 GMT (1608kb,D)

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