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Electrical Engineering and Systems Science > Systems and Control
Title: DeepScaleTool : A Tool for the Accurate Estimation of Technology Scaling in the Deep-Submicron Era
(Submitted on 19 Feb 2021)
Abstract: The estimation of classical CMOS "constant-field" or "Dennard" scaling methods that define scaling factors for various dimensional and electrical parameters have become less accurate in the deep-submicron regime, which drives the need for better estimation approaches especially in the educational and research domains. We present DeepScaleTool, a tool for the accurate estimation of deep-submicron technology scaling by modeling and curve fitting published data by a leading commercial fabrication company for silicon fabrication technology generations from 130~nm to 7~nm for the key parameters of area, delay, and energy. Compared to 10~nm--7~nm scaling data published by a leading foundry, the DeepScaleTool achieves an error of 1.7% in area, 2.5% in delay, and 5% in power. This compares favorably with another leading academic estimation method that achieves an error of 24% in area, 9.1% in delay, and 24.9% in power.
Submission history
From: Satyabrata Sarangi [view email][v1] Fri, 19 Feb 2021 22:53:44 GMT (1608kb,D)
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