References & Citations
Computer Science > Computer Vision and Pattern Recognition
Title: Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy
(Submitted on 18 Apr 2021 (v1), last revised 20 Aug 2021 (this version, v2))
Abstract: Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. Taking advantage of these advances in data collection rates requires the development and application of data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this paper, we highlight a few areas in materials science that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook on opportunities of integrating signal processing with automated TEM data analysis.
Submission history
From: Shixiang Zhu [view email][v1] Sun, 18 Apr 2021 02:56:04 GMT (20004kb,D)
[v2] Fri, 20 Aug 2021 19:46:35 GMT (20087kb,D)
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