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Computer Science > Computer Vision and Pattern Recognition

Title: Few-Shot Learning with a Strong Teacher

Abstract: Few-shot learning (FSL) aims to generate a classifier using limited labeled examples. Many existing works take the meta-learning approach, constructing a few-shot learner that can learn from few-shot examples to generate a classifier. Typically, the few-shot learner is constructed or meta-trained by sampling multiple few-shot tasks in turn and optimizing the few-shot learner's performance in generating classifiers for those tasks. The performance is measured by how well the resulting classifiers classify the test (i.e., query) examples of those tasks. In this paper, we point out two potential weaknesses of this approach. First, the sampled query examples may not provide sufficient supervision for meta-training the few-shot learner. Second, the effectiveness of meta-learning diminishes sharply with the increasing number of shots. To resolve these issues, we propose a novel meta-training objective for the few-shot learner, which is to encourage the few-shot learner to generate classifiers that perform like strong classifiers. Concretely, we associate each sampled few-shot task with a strong classifier, which is trained with ample labeled examples. The strong classifiers can be seen as the target classifiers that we hope the few-shot learner to generate given few-shot examples, and we use the strong classifiers to supervise the few-shot learner. We present an efficient way to construct the strong classifier, making our proposed objective an easily plug-and-play term to existing meta-learning based FSL methods. We validate our approach, LastShot, in combinations with many representative meta-learning methods. On several benchmark datasets, our approach leads to a notable improvement across a variety of tasks. More importantly, with our approach, meta-learning based FSL methods can outperform non-meta-learning based methods at different numbers of shots.
Comments: Accepted to publish on IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI)
Subjects: Computer Vision and Pattern Recognition (cs.CV); Artificial Intelligence (cs.AI); Machine Learning (cs.LG)
Cite as: arXiv:2107.00197 [cs.CV]
  (or arXiv:2107.00197v2 [cs.CV] for this version)

Submission history

From: Wei-Lun Chao [view email]
[v1] Thu, 1 Jul 2021 03:20:46 GMT (971kb,D)
[v2] Mon, 11 Jul 2022 01:37:45 GMT (3553kb,D)

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