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Condensed Matter > Materials Science

Title: The Huygens Principle of Angle-Resolved Photoemission

Authors: Simon Moser
Abstract: Angle-resolved photoemission spectroscopy (ARPES) measures the interference of dipole allowed Coulomb wavelets from the individual orbital emitters that contribute to an electronic band. If Coulomb scattering of the outgoing electron is neglected, this Huygens view of ARPES simplifies to a Fraunhofer diffraction experiment, and the relevant cross-sections to orbital Fouriertransforms. This plane wave approximation (PWA) is surprisingly descriptive of photoelectron distributions, but fails to reproduce kinetic energy dependent final state effects like dichroism. Yet, Huygens principle of ARPES can be easily adapted to allow for distortion and phase shift of the outgoing Coulomb wave. This retains the strong physical intuition and low computational cost of the PWA, but naturally captures momentum dependent interference effects in systems that so far required treatment at the ab initio level, such as linear dichroism in Rashba systems BiAg2 and AgTe.
Subjects: Materials Science (cond-mat.mtrl-sci); Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
Cite as: arXiv:2201.04576 [cond-mat.mtrl-sci]
  (or arXiv:2201.04576v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Simon Moser [view email]
[v1] Wed, 12 Jan 2022 17:09:34 GMT (1913kb,D)

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