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Condensed Matter > Materials Science
Title: Simulating dark-field x-ray microscopy images with wave front propagation techniques
(Submitted on 19 Jan 2022 (v1), last revised 23 Feb 2022 (this version, v2))
Abstract: Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experimental data from a near-perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume.
Submission history
From: Mads Allerup Carlsen [view email][v1] Wed, 19 Jan 2022 11:59:56 GMT (5206kb,D)
[v2] Wed, 23 Feb 2022 09:52:10 GMT (1911kb,D)
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