Title: From superconductor stability and relaxation to Andreev reflections

Abstract: How exactly can critical temperature be determined from results obtained in resistivity measurements? An unconventional approach using an electrical network is presented in this paper. In a first step, a recently suggested, dynamic relaxation model is refined and extended beyond its proper applicability and competence (superconductor stability against quench). This step addresses bending of the resistivity, \r{ho}El(T), vs. temperature curves near critical temperature. In a second step, an alternative solution of the thermal fluctuations problem is presented. From both results, existence of a non-local, transition boundary layer can be postulated, a temperature uncertainty around critical temperature. This replaces rather intuitive estimates frequently found in the literature. Finally, limitations of the suggested procedure arise from Andreev reflection and from other non-Ohmic contributions to total current through thin film junctions. An interesting parallel to multi-component heat transfer and its treatment by analytic solutions becomes obvious.