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Computer Science > Computer Vision and Pattern Recognition

Title: A Feature Memory Rearrangement Network for Visual Inspection of Textured Surface Defects Toward Edge Intelligent Manufacturing

Abstract: Recent advances in the industrial inspection of textured surfaces-in the form of visual inspection-have made such inspections possible for efficient, flexible manufacturing systems. We propose an unsupervised feature memory rearrangement network (FMR-Net) to accurately detect various textural defects simultaneously. Consistent with mainstream methods, we adopt the idea of background reconstruction; however, we innovatively utilize artificial synthetic defects to enable the model to recognize anomalies, while traditional wisdom relies only on defect-free samples. First, we employ an encoding module to obtain multiscale features of the textured surface. Subsequently, a contrastive-learning-based memory feature module (CMFM) is proposed to obtain discriminative representations and construct a normal feature memory bank in the latent space, which can be employed as a substitute for defects and fast anomaly scores at the patch level. Next, a novel global feature rearrangement module (GFRM) is proposed to further suppress the reconstruction of residual defects. Finally, a decoding module utilizes the restored features to reconstruct the normal texture background. In addition, to improve inspection performance, a two-phase training strategy is utilized for accurate defect restoration refinement, and we exploit a multimodal inspection method to achieve noise-robust defect localization. We verify our method through extensive experiments and test its practical deployment in collaborative edge--cloud intelligent manufacturing scenarios by means of a multilevel detection method, demonstrating that FMR-Net exhibits state-of-the-art inspection accuracy and shows great potential for use in edge-computing-enabled smart industries.
Comments: Revision to IEEE transactions on automation science and engineering
Subjects: Computer Vision and Pattern Recognition (cs.CV); Artificial Intelligence (cs.AI)
Cite as: arXiv:2206.10830 [cs.CV]
  (or arXiv:2206.10830v1 [cs.CV] for this version)

Submission history

From: Haiming Yao [view email]
[v1] Wed, 22 Jun 2022 04:05:13 GMT (39278kb,D)

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