References & Citations
Condensed Matter > Mesoscale and Nanoscale Physics
Title: Electrical Nanoprobing of Semiconducting Carbon Nanotubes using an Atomic Force Microscope
(Submitted on 6 May 2003 (v1), last revised 21 Nov 2003 (this version, v3))
Abstract: We use an Atomic Force Microscope (AFM) tip to locally probe the electronic properties of semiconducting carbon nanotube transistors. A gold-coated AFM tip serves as a voltage or current probe in three-probe measurement setup. Using the tip as a movable current probe, we investigate the scaling of the device properties with channel length. Using the tip as a voltage probe, we study the properties of the contacts. We find that Au makes an excellent contact in the p-region, with no Schottky barrier. In the n-region large contact resistances were found which dominate the transport properties.
Submission history
From: Ji-Yong Park [view email][v1] Tue, 6 May 2003 14:27:46 GMT (221kb)
[v2] Tue, 13 May 2003 14:05:38 GMT (177kb)
[v3] Fri, 21 Nov 2003 17:21:49 GMT (301kb)
Link back to: arXiv, form interface, contact.