References & Citations
Condensed Matter > Materials Science
Title: Preparation of atomically clean and flat Si(100) surfaces by low-energy ion sputtering and low-temperature annealing
(Submitted on 15 Jun 2003)
Abstract: Si(100) surfaces were prepared by wet-chemical etching followed by 0.3-1.5keV Ar ion sputtering, either at elevated or room temperature. After a brief anneal under ultrahigh vacuum conditions, the resulting surfaces were examined by scanning tunneling microscopy. We find that wet-chemical etching alone cannot produce a clean and flat Si(100) surface. However, subsequent 300eV Ar ion sputtering at room temperature followed by a 973K anneal yields atomically clean and flat Si(100) surfaces suitable for nanoscale device fabrication.
Link back to: arXiv, form interface, contact.