Electronic Transport through YBCO Grain Boundary Interfaces between 4.2 K and 300 K

Schneider, C. W.; Hembacher, S.; Hammerl, G.; Held, R.; Schmehl, A.; Weber, A.; Kopp, T.; Mannhart, J.

doi:10.1103/PhysRevLett.92.257003

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Condensed Matter > Superconductivity

Title: Electronic Transport through YBCO Grain Boundary Interfaces between 4.2 K and 300 K

Authors: C.W. Schneider, S. Hembacher, G. Hammerl, R. Held, A. Schmehl, A. Weber, T. Kopp, J. Mannhart

(Submitted on 18 Jul 2003 (v1), last revised 19 Nov 2003 (this version, v2))

Abstract: The current-induced dissipation in YBCO grain boundary tunnel junctions has been measured between 4.2 K and 300 K. It is found that the resistance of 45 degree (100)/(110) junctions decreases linearly by a factor of four when their temperature is increased from 100 K to 300 K. At the superconducting transition temperature Tc the grain boundary resistance of the normal state and of the superconducting state extrapolate to the same value.

Comments:	14 pages, 4 figures
Subjects:	Superconductivity (cond-mat.supr-con); Strongly Correlated Electrons (cond-mat.str-el)
Journal reference:	Phys. Rev. Lett. 92, 257003 (2004)
DOI:	10.1103/PhysRevLett.92.257003
Cite as:	arXiv:cond-mat/0307470 [cond-mat.supr-con]
	(or arXiv:cond-mat/0307470v2 [cond-mat.supr-con] for this version)

Submission history

From: German Hammerl [view email]
[v1] Fri, 18 Jul 2003 14:54:02 GMT (437kb)
[v2] Wed, 19 Nov 2003 12:42:05 GMT (441kb)

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