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Condensed Matter > Mesoscale and Nanoscale Physics

Title: Kelvin Probe Spectroscopy of a Two-Dimensional Electron Gas Below 300 mK

Abstract: A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in an Ga[Al]As heterostructure. At different separations between AFM tip and sample, a dc-voltage is applied between the tip and the electron gas while simultaneously recording the frequency shift of the oscillating tip. Using a plate capacitor model the local electron density can be extracted from the data. The result coincides within 10% with the data obtained from transport measurements.
Comments: 3 pages, 3 figures
Subjects: Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
Journal reference: Appl. Phys. Lett. 83, 2602 (2003)
DOI: 10.1063/1.1614836
Cite as: arXiv:cond-mat/0308069 [cond-mat.mes-hall]
  (or arXiv:cond-mat/0308069v1 [cond-mat.mes-hall] for this version)

Submission history

From: Klaus Ensslin [view email]
[v1] Tue, 5 Aug 2003 15:51:30 GMT (184kb)

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