Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES

Kamakura, N.; Takata, Y.; Tokushima, T.; Harada, Y.; Chainani, A.; Kobayashi, K.; Shin, S.

doi:10.1209/epl/i2004-10052-6

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Condensed Matter > Strongly Correlated Electrons

Title: Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES

Authors: N. Kamakura, Y. Takata, T. Tokushima, Y. Harada, A. Chainani, K. Kobayashi, S. Shin

(Submitted on 24 Nov 2003 (v1), last revised 21 Apr 2004 (this version, v2))

Abstract: Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study in-plane band dispersions of Nickel as a function of probing depth. Photon energies between 190 and 780 eV were used to effectively probe up to 3-7 layers. The results show layer dependent band dispersion of the Delta_2 minority-spin band which crosses the Fermi level in 3 or more layers, in contrast to known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced correlation effects in the bulk compared to the surface.

Comments:	7 pages, 3 figures Revised text and figure
Subjects:	Strongly Correlated Electrons (cond-mat.str-el); Materials Science (cond-mat.mtrl-sci)
DOI:	10.1209/epl/i2004-10052-6
Cite as:	arXiv:cond-mat/0311547 [cond-mat.str-el]
	(or arXiv:cond-mat/0311547v2 [cond-mat.str-el] for this version)

Submission history

From: Nozomu Kamakura [view email]
[v1] Mon, 24 Nov 2003 17:07:12 GMT (549kb)
[v2] Wed, 21 Apr 2004 02:01:34 GMT (554kb)

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