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Condensed Matter > Materials Science

Title: Molecular electronics exploiting sharp structure in the electrode density-of-states. Negative differential resistance and Resonant Tunneling in a poled molecular layer on Al/LiF electrodes

Authors: Z.H. Lu, M.W.C. Dharma-wardana, R.S. Khangura, Marek Z. Zgierski, Douglas Ritchie (University of Torornto, and National Research council of Canada)
Abstract: Density-functional calculations are used to clarify the role of an ultrathin LiF layer on Al electrodes used in molecular electronics. The LiF layer creates a sharp density of states (DOS), as in a scanning-tunneling microscope (STM) tip. The sharp DOS, coupled with the DOS of the molecule leads to negative differential resistance (NDR). Electron transfer between oriented molecules occurs via resonant tunneling. The I-V characteristic for a thin-film of tris (8-hydroxyquinoline)- aluminum (AlQ) molecules, oriented using electric-field poling, and sandwiched between two Al/LiF electrodes is in excellent agreement with theory. This molecular device presents a new paradigm for a convenient, robust, inexpensive alternative to STM or mechanical break-junction structures.
Comments: 5 pages, 3 figures
Subjects: Materials Science (cond-mat.mtrl-sci)
Journal reference: Applied Physics letters, vol 85, pp. 323-325 (2004)
DOI: 10.1063/1.1764935
Cite as: arXiv:cond-mat/0402257 [cond-mat.mtrl-sci]
  (or arXiv:cond-mat/0402257v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Chandre Dharma-Wardana [view email]
[v1] Mon, 9 Feb 2004 18:32:29 GMT (29kb)

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