References & Citations
Condensed Matter > Materials Science
Title: Electronic mechanism of ion expulsion under UV nanosecond laser excitation of silicon: Experiment and modeling
(Submitted on 12 Mar 2004 (v1), last revised 14 Mar 2004 (this version, v2))
Abstract: We present experimental and modeling studies of UV nanosecond pulsed laser desorption and ablation of (111) bulk silicon. The results involve a new approach to the analysis of plume formation dynamics under high-energy photon irradiation of the semiconductor surface. Non-thermal, photo-induced desorption has been observed at low laser fluence, well below the melting threshold. Under ablation conditions, the non-thermal ions have also a high concentration. The origin of these ions is discussed on the basis of electronic excitation of Si surface states associated with the Coulomb explosion mechanism. We present a model describing dynamics of silicon target excitation, heating and harge-carrier transport.
Submission history
From: Igor Ozerov [view email] [via CCSD proxy][v1] Fri, 12 Mar 2004 19:29:37 GMT (227kb)
[v2] Sun, 14 Mar 2004 16:34:18 GMT (228kb)
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