Anisotropy of Resonant Inelastic X-Ray Scattering at the K Edge of Si:Theoretical Analysis

Nisikawa, Yunori; Usuda, Manabu; Igarashi, Jun-ichi

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Condensed Matter > Materials Science

Title: Anisotropy of Resonant Inelastic X-Ray Scattering at the K Edge of Si:Theoretical Analysis

Authors: Yunori Nisikawa, Manabu Usuda, Jun-ichi Igarashi

(Submitted on 1 May 2004 (v1), revised 16 Jun 2004 (this version, v2), latest version 18 Apr 2006 (v4))

Abstract: We investigate theoretically the resonant inelastic x-ray scattering (RIXS) at the K edge of Si with systematically varying transfered-momenta, incident-photon energy and incident-photon polarization. We confirm theoretically the anisotropy of a RIXS and provide a quantitative explanation of a experiment on RIXS at the K edge of Si (Y. Ma et al., Phys. Rev. Lett. 74, 478 (1995)). We clarify the implication of the spectral shape.

Comments:	15 pages, 8 figures to be submitted
Subjects:	Materials Science (cond-mat.mtrl-sci)
Cite as:	arXiv:cond-mat/0405009 [cond-mat.mtrl-sci]
	(or arXiv:cond-mat/0405009v2 [cond-mat.mtrl-sci] for this version)

Submission history

From: Yunori Nisikawa [view email]
[v1] Sat, 1 May 2004 12:02:09 GMT (116kb)
[v2] Wed, 16 Jun 2004 08:35:38 GMT (117kb)
[v3] Sat, 28 Aug 2004 09:30:35 GMT (141kb)
[v4] Tue, 18 Apr 2006 04:05:14 GMT (141kb)

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