Electric field induced narrowing of exciton line width

Ponomarev, I. V.; Deych, L. I.; Lisyansky, A. A.

doi:10.1103/PhysRevB.72.115304

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Condensed Matter > Disordered Systems and Neural Networks

Title: Electric field induced narrowing of exciton line width

Authors: I. V. Ponomarev, L. I. Deych, A. A. Lisyansky

(Submitted on 12 Aug 2004 (v1), last revised 27 Oct 2005 (this version, v2))

Abstract: Considering effects of electric field on the low temperature absorption line of quantum well excitons, we show that, for moderate strength of the electric field, the main contribution to the field dependence of the line-width results from field induced modifications of inhomogeneous broadening of excitons. We find that the strength of the random potential acting on quantum well excitons due to alloy disorder and interface roughness can either decrease or increase with field depending upon the thickness of the well. This means that under certain conditions one can observe counterintuitive narrowing of exciton spectral lines in electric field.

Comments:	RevTeX4, 4 pages, 1 figure; submitted to Phys. Rev. Lett
Subjects:	Disordered Systems and Neural Networks (cond-mat.dis-nn); Materials Science (cond-mat.mtrl-sci)
Journal reference:	Phys. Rev. B 72, 115304 (2005)
DOI:	10.1103/PhysRevB.72.115304
Cite as:	arXiv:cond-mat/0408296 [cond-mat.dis-nn]
	(or arXiv:cond-mat/0408296v2 [cond-mat.dis-nn] for this version)

Submission history

From: Ilya Ponomarev [view email]
[v1] Thu, 12 Aug 2004 22:38:16 GMT (23kb)
[v2] Thu, 27 Oct 2005 18:56:42 GMT (75kb)

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