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Condensed Matter > Materials Science

Title: Ultrathin Organic Transistors on Oxide Surfaces

Authors: Maren Daraktchiev (1), Adrian von Muehlenen (1), Frank Nuesch (1), Michel Schaer (1), Martin Brinkmann (2), Marie-Noelle Bussac (3), Libero Zuppiroli (1) ((1)Ecole Polytechnique Federale de Lausanne, Suisse, (2) Institut Charles Sadron, Strasbourg, France, (3) Ecole Polytechnique, Palaiseau, France)
Abstract: In recent years, thin-film organic field-effect transistors (OFETs) have begun to be considered as a possible alternative to the hydrogenated amorphous silicon thin-film transistors (a-Si:H TFT's) used in active matrix flat panel displays and other large-area electronics applications. Low-temperature processability, low-cost fabrication and compatibility with arbitrary substrates are some of the promising advantages of OFETs, among others. Of the many organic materials available, pentacene, in particular, is one of the leading candidates for use in current thin-film OFET architectures - this because of its excellent electrical characteristics and its resistance to atmospheric oxygen. In the recent literature, pentacene's transport properties, as well as transistor performance, have already been analyzed from the point of view of substrate treatments, pentacene evaporation rate and substrate temperature, electrode chemical nature and channel geometry. The results show that the morphology, crystal structure and molecular ordering of the first organic monolayer(s) at the pentacene/dielectric interface are essential determinants of carrier transport phenomena. To further investigate these interface effects, we have built a model organic field-effect transistor which consists essentially of a single layer of pentacene on an oxide substrate. Four-probe and two-probe transport measurements as a function of temperature and fields will be presented in relation with structural near-field observations. The experimental results suggest a simple two-dimensional model where the equilibrium between free and trapped carriers at the oxide interface determines the OFET characteristics and performance.
Comments: 16 pages with 4 figures, submitted to Advanced Materials
Subjects: Materials Science (cond-mat.mtrl-sci)
Journal reference: New Journal of Physics 7 133 (2005)
DOI: 10.1088/1367-2630/7/1/133
Cite as: arXiv:cond-mat/0408562 [cond-mat.mtrl-sci]
  (or arXiv:cond-mat/0408562v2 [cond-mat.mtrl-sci] for this version)

Submission history

From: Maren Daraktchiev [view email]
[v1] Thu, 26 Aug 2004 08:49:21 GMT (531kb)
[v2] Fri, 27 Aug 2004 13:14:30 GMT (531kb)

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