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Condensed Matter > Materials Science

Title: Observed Effects of a Changing Step-Edge Density on Thin-Film Growth Dynamics

Abstract: We grew SrTiO3 on SrTiO3 [001] by pulsed laser deposition, while observing x-ray diffraction at the (0 0 .5) position. The drop dI in the x-ray intensity following a laser pulse contains information about plume-surface interactions. Kinematic theory predicts dI/I = -4sigma(1-sigma), so that dI/I depends only on the amount of deposited material sigma. In contrast, we observed experimentally that |dI/I| < 4sigma(1-sigma), and that dI/I depends on the phase of x-ray growth oscillations. The combined results suggest a fast smoothing mechanism that depends on surface step-edge density.
Comments: 4 figures
Subjects: Materials Science (cond-mat.mtrl-sci)
Journal reference: Physical Review Letters, vol. 94, art no 036102 (2005)
DOI: 10.1103/PhysRevLett.94.036102
Cite as: arXiv:cond-mat/0408704 [cond-mat.mtrl-sci]
  (or arXiv:cond-mat/0408704v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Joel Brock [view email]
[v1] Tue, 31 Aug 2004 18:36:43 GMT (47kb)

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