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Condensed Matter > Materials Science

Title: Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

Abstract: The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background caused by the experimental setup. This allows, for the first time, a quantitative, frequency independent analysis of the domain contrast which is in good agreement with the expected values for the piezoelectric deformation of the sample and satisfies the generally required features of PFM imaging.
Subjects: Materials Science (cond-mat.mtrl-sci)
Journal reference: Appl. Phys. Lett. 89, 163507 (2006)
DOI: 10.1063/1.2362984
Cite as: arXiv:cond-mat/0510005 [cond-mat.mtrl-sci]
  (or arXiv:cond-mat/0510005v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Elisabeth Soergel Dr [view email]
[v1] Fri, 30 Sep 2005 22:35:05 GMT (166kb)

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