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Condensed Matter > Materials Science

Title: Interface-anisotropy induced asymmetry of intermixing in bilayers

Abstract: The ion-sputtering induced intermixing is studied by molecular dynamics (MD) simulations and by Auger electron spectroscopy depth profiling (AES-DP) analysis in Pt/Ti/Si substrate (Pt/Ti) and Ta/Ti/Pt/Si substrate (Ti/Pt) multilayers. Experimental evidence is found for the asymmetry of intermixing in Pt/Ti and in Ti/Pt. An unexpected enhancement of the injection of the heavy Pt atoms into the Ti substrate is observed both by AES-DP and by MD simulations. In Ti/Pt we get a much weaker interdiffusion than in Pt/Ti. The asymmetry is explained by the backscattering of hyperthermal particles at the mass-anisotropic interface and which is reproduced by computer atomistic simulations. The AES-DP measurements support our earlier predictions (P. S\"ule, M. Menyh\'ard, Phys. Rev., {\bf B71}, 113413 (2005)) obtained for mass-anisotropic bilayers.
Comments: 4 pages, 4 figures, sule@mfa.kfki.hu
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:cond-mat/0510077 [cond-mat.mtrl-sci]
  (or arXiv:cond-mat/0510077v1 [cond-mat.mtrl-sci] for this version)

Submission history

From: Dr. Peter S"ule [view email]
[v1] Tue, 4 Oct 2005 11:22:28 GMT (77kb)

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