Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures

Jungk, T.; Hoffmann, A.; Soergel, E.

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Condensed Matter > Materials Science

Title: Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures

Authors: T. Jungk, A. Hoffmann, E. Soergel

(Submitted on 16 Dec 2005 (v1), last revised 26 May 2007 (this version, v2))

Abstract: The interpretation of ferroelectric domain images obtained with piezoresponse force microscopy (PFM) is discussed. The influences of an inherent experimental background on the domain contrast in PFM images (enhancement, nulling, inversion) as well as on the shape and the location of the domain boundaries are described. We present experimental results to evidence our analysis of the influence of the background on the domain contrast in PFM images.

Subjects:	Materials Science (cond-mat.mtrl-sci)
Journal reference:	J. Microsc.-Oxford 227, 76-82 (2007)
Cite as:	arXiv:cond-mat/0512373 [cond-mat.mtrl-sci]
	(or arXiv:cond-mat/0512373v2 [cond-mat.mtrl-sci] for this version)

Submission history

From: Elisabeth Soergel Dr [view email]
[v1] Fri, 16 Dec 2005 19:22:52 GMT (464kb)
[v2] Sat, 26 May 2007 00:40:31 GMT (273kb)

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