Epitaxy of thin films of the Heusler compound Co2Cr0.6Fe0.4Al

Conca, A.; Jourdan, M.; Herbort, C.; Adrian, H.

doi:10.1016/j.jcrysgro.2006.11.214

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Condensed Matter > Materials Science

Title: Epitaxy of thin films of the Heusler compound Co2Cr0.6Fe0.4Al

Authors: A. Conca, M. Jourdan, C. Herbort, H. Adrian

(Submitted on 29 May 2006 (v1), last revised 1 Dec 2006 (this version, v2))

Abstract: Epitaxial thin films of the highly spin polarized Heusler compound Co2Cr0.6Fe0.4Al are deposited by dc magnetron sputtering. It is shown by XRD and TEM investigations how the use of an Fe buffer layer on MgO(100) substrates supports the growth of highly ordered Co2Cr0.6Fe0.4Al at low deposition temperatures. The as grown samples show a relatively large ordered magnetic moment of mu = 3.0mu_B/f.u. providing evidence for a low level of disorder.

Comments:	accepted by J. of Crystal Growth
Subjects:	Materials Science (cond-mat.mtrl-sci)
DOI:	10.1016/j.jcrysgro.2006.11.214
Cite as:	arXiv:cond-mat/0605698 [cond-mat.mtrl-sci]
	(or arXiv:cond-mat/0605698v2 [cond-mat.mtrl-sci] for this version)

Submission history

From: Martin Jourdan [view email]
[v1] Mon, 29 May 2006 09:26:33 GMT (689kb)
[v2] Fri, 1 Dec 2006 08:27:21 GMT (690kb)

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