References & Citations
Condensed Matter > Materials Science
Title: Crosstalk Correction in Atomic Force Microscopy
(Submitted on 5 Oct 2006)
Abstract: Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately. A slight angle between the orientation of the photodiode and the plane of the readout beam, however, causes false signals in both readout channels, so-called crosstalk, that may lead to misinterpretation of the acquired data. We demonstrate this fault with images recorded in contact mode on ferroelectric crystals and present an electronic circuit to compensate for it, thereby enabling crosstalk-free imaging.
Submission history
From: Elisabeth Soergel Dr [view email][v1] Thu, 5 Oct 2006 22:41:41 GMT (264kb)
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