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Physics > Instrumentation and Detectors

Title: The instrument response function in air-based scanning tunneling microscopy

Abstract: The distinction between point and line resolution in transmission electron microscopy (TEM) arises because an ability to image sub-0.2 nm fringes is a necessary, but not a sufficient, condition for imaging individual atoms. In scanned tip microscopy, as in TEM, empirical data on instrument response should precede assertions about point resolution. In the ``slow scan limit'', time-domain noise and geometry effects decouple, and tip shape can take on the role of a 2-dimensional impulse response function. We indicate here that nuclear track pits can be used to quantitatively measure tip geometry with nanometer-scale resolution in three dimensions, that stationary tip images provide a robust measure of time-domain instabilities, and that when these data are taken before and after imaging an unknown, images with instrument response quantitatively constrained by experiment are possible. Specimen-induced tip effects also become measurable in situ.
Comments: 4 pages (1 fig, 16 refs) RevTeX; apps this http URL
Subjects: Instrumentation and Detectors (physics.ins-det); Materials Science (cond-mat.mtrl-sci); Optics (physics.optics)
Journal reference: Ultramicroscopy 37 (1991) 125-129
Report number: UMStL-CME-90d27pf
Cite as: arXiv:physics/9712003 [physics.ins-det]
  (or arXiv:physics/9712003v1 [physics.ins-det] for this version)

Submission history

From: Phil Fraundorf [view email]
[v1] Mon, 1 Dec 1997 15:50:12 GMT (94kb)

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